Nanoscale Subsurface Spectroscopy and Tomography

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This is a Multi-University Research Initiative (MURI) titled "New Instrumentation for Nanoscale Subsurface Spectroscopy and Tomography" funded by the Air Force Office of Scientific Research (AFOSR) under grant F49620-03-1-0379.
Program director: Dr. Gernot Pomrenke


Objective/Approach: The project is aimed at developing techniques for imaging and characterizing nanoscale subsurface structures. Determination of chemical composition and material properties is accomplished by near-field microwave, infrared, fluorescence, and Raman spectroscopy. The three-dimensional structure is reconstructed using near-field tomography and novel theoretical inversion algorithms.

Newsflash:

  • The 2008 research results are posted on the Research page.
  • Lukas Novotny authors a PRL paper on "Optical Antennas".
  • The American Chemical Society has appointed Paul S. Weiss editor of ACS Nano, a monthly journal about nanoscale science and technology that will begin publication in third-quarter 2007. More ...
  • The MURI research team met in March for their 2nd workshop in Lenox, MA. More...
  • Bennett Goldberg and his group at Boston University have developed the application of a novel interferometric technique called Spectral Self-Interference Fluorescence Microscopy (SSFM) to the precise measurement of the average location of a fluorescent label in a DNA layer relative to the surface and thus determine specific information on the conformation of the surface-bound DNA molecules. Read the recently in PNAS published article here.
  • Paul Weiss' group at Penn State et al. have for the first time manipulated hydrogen atoms into stable sites beneath the surface of a palladium crystal, creating a structure predicted to be important in metal catalysts, in hydrogen storage, and in fuel cells. Click here to find out more.
  • Lukas Novotny's group at the University of Rochester has, for the first time, demonstrated that near-field Raman scattering can localize defects in carbon nanotubes with a resolution better than 15nm.
    They also have recently demonstrated, using near-field Raman spectroscopy, the ability to produce chemically specific maps of carbon nanotubes buried beneath a dielectric capping layer with a spatial resolution of 30 nm. This experimental work holds promise for future work localizing defects in semiconductor devices. Read the recent results published in Nano Letters .
  • Selim Unlu's group at Boston University found that numerical aperture increasing lens (NAIL) performs far superior for subsurface imaging of integrated silicon devices compared with state-of-the-art imaging systems used by the high-tech industry.
  • Scott Carney in collaboration with D L Marks presented a novel means of measuring the near-field that avoids the use of sharp probes. The method relies on a solution of the inverse scattering problem developed in the course of this MURI. Read "Near-field diffractive elements" Opt. Lett. 30 1870--1872 (2005).
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    Web page maintained by: Barbara Schirmer, University of Rochester, NY @email

    last update: 11/6/09