is a Multi-University Research Initiative (MURI) titled "New
Instrumentation for Nanoscale Subsurface Spectroscopy and Tomography"
funded by the Air Force Office of Scientific Research (AFOSR) under grant F49620-03-1-0379.
Program director: Dr. Gernot Pomrenke
The project is aimed at developing techniques for imaging and characterizing
nanoscale subsurface structures. Determination of chemical composition
and material properties is accomplished by near-field microwave,
infrared, fluorescence, and Raman spectroscopy. The three-dimensional
structure is reconstructed using near-field tomography and novel
theoretical inversion algorithms.
The 2008 research results are posted on the Research
Lukas Novotny authors a
PRL paper on "Optical Antennas".
The American Chemical Society has appointed Paul
S. Weiss editor of ACS Nano, a monthly journal about nanoscale
science and technology that will begin publication in third-quarter
The MURI research team met in March for their 2nd workshop
in Lenox, MA. More...
Bennett Goldberg and his
group at Boston University have developed the application of a novel
interferometric technique called Spectral Self-Interference Fluorescence
Microscopy (SSFM) to the precise measurement of the average location
of a fluorescent label in a DNA layer relative to the surface and
thus determine specific information on the conformation of the surface-bound
DNA molecules. Read the recently in PNAS published article here.
Paul Weiss' group at Penn
State et al. have for the first time manipulated hydrogen atoms
into stable sites beneath the surface of a palladium crystal, creating
a structure predicted to be important in metal catalysts, in hydrogen
storage, and in fuel cells. Click here
to find out more.
Lukas Novotny's group at
the University of Rochester has, for the first time, demonstrated
that near-field Raman scattering can localize defects in carbon
nanotubes with a resolution better than 15nm.
They also have recently demonstrated, using near-field Raman spectroscopy,
the ability to produce chemically specific maps of carbon nanotubes
buried beneath a dielectric capping layer with a spatial resolution
of 30 nm. This experimental work holds promise for future work localizing
defects in semiconductor devices. Read the recent results published
in Nano Letters .
Selim Unlu's group at Boston
University found that numerical aperture increasing lens (NAIL)
performs far superior for subsurface imaging of integrated silicon
devices compared with state-of-the-art imaging systems used by the
Scott Carney in collaboration
with D L Marks presented a novel means of measuring the near-field
that avoids the use of sharp probes. The method relies on a solution
of the inverse scattering problem developed in the course of this
MURI. Read "Near-field diffractive elements" Opt. Lett.
30 1870--1872 (2005).