Daguerreotype TEM Sample Preparation Using
Gas Injection and Focused Ion Beam Milling

Alex Mann1, Brian McIntyre2, Ralph Wiegandt3
1URnano, Department of Physics & Astronomy
2Department of Optics, University of Rochester, Rochester, NY 14627, USA
3George Eastman House International Museum of Photography and Film, Rochester, NY 14607, USA

leftIntroductionFIB MillingSample RelocationTEM Grid WeldingCitationsHomeright


FIB Sample

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